LIBROS PUBLICADOS

Meeker; W. Q. and L. A. Escobar. "Statistical Methods for Reliability Data" John Wiley & Sons, Inc. 1998. 

ARTÍCULOS PUBLICADOS

Escobar, L. A., W. Q. Meeker, D- L. Kugler, L. L. Kramer. 2003. "Accelerated Destructive Degradation Tests: Data, Models, and Analysis." Mathematical Methods in Reliability.

Meeker, W. Q. and, Luis A. Escobar. 2002. "Software for Reliability Data Analysis and Test Planning." Brazilian Journal of Probability and Statistics, 169-200.

Escobar, L. A., and W. Q. Meeker. 2001. 'Thc Asymptotic Equivalence of the Fisher Information Matrices for Type I and Type II Censored Data from Location-Scale Families." Communications in Statistics-Theory and Methods 30 (10): 3211-2225.

Meeker;W. Q, L. A. Escobar, L. A., and V. Chan, V. 2001. “Using Accelerated Test to Predict Service Life in Highly-Variable Environments." To appear in A Systems Approach to Service Life Prediction of Organic Coatings Washington: American Chemical Society, D. R. Bauer and J. W. Martin, Editors.

Meeker, W. Q., and L. A. Escobar. 1999. “Accelerated life Tests: Concepts and Data Analysis." A Systems Approach to Service Life Prediction of Organic Coatings Washington: American Chemical Society, D. R. Bauer and J. W. Martin, Editors.

Meeker, W. Q., and L. A. Escobar. 1998. "Pitfalls of Accelerated Testing” IEEE Transactions on Reliability 47; 114-118.

Meeker, W. Q, L. A. Escobar, and C. Joseph Lu. 1998 "Accelerated Degradation Test: Modeling and Analysis”. Technometrics 40: 89-99.

Escobar, L. A., and W. Q. Meeker. 1997. "The Asymptotic Covariance Matrix for Maximum Likelihood Estimators with Models based on Location-Scale Distribution Involving Censoring, Truncation, and Explanatory Variables." Statistica Sinica 8: 221-237.

Lu, C. J, W. Q. Meeker, and L. A. Escobar. 1996. “A Comparison of Degradation, and Failure Time Analysis Methods of Estimating a Time-to-Failure Distribution.” Statistica Sinica 6: 531-546.

Escobar, L. A., and W. Q. Meeker. 1995. "Planning Accelerated Life Tests with Two or More Experimental Factors." Technometrics 37: 411-427.

Meeker, W.Q., and L.A. Escobar. 1995, “Teaching About Approximate Confidence Regions Based on Maximum Likelihood Estimation” The American Statistician. 49:151-160.